ELECTRICAL TRANSPORT-PROPERTIES OF JOSEPHSON-JUNCTIONS USING POLYIMIDE LANGMUIR-BLODGETT-FILMS

被引：17

作者：

IWAMOTO, M ^{[1
]}

KUBOTA, T ^{[1
]}

NAKAGAWA, M ^{[1
]}

SEKINE, M ^{[1
]}

机构：

[1] TOKYO INST TECHNOL,DEPT APPL ELECTR,MIDORI KU,YOKOHAMA,KANAGAWA 227,JAPAN

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1990年 / 29卷 / 01期

关键词：

Josephson junction; LB; Polyimide; Ultrathin film;

D O I：

10.1143/JJAP.29.116

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Using thermally stable ultrathin polyimide (PI) Langmuir-Blodgett films, we made tunnel junctions having structures of Nb/PI/(Pb–Bi) and Au/PI/(Pb–Bi). Then we examined the electrical transport properties of the junctions. Here, Nb and Pb-Bi are superconducting electrodes, and Au is a base-(noble metal) electrode. For Nb/PI/(Pb–Bi) junctions, it was found that an inherent oxide layer formed on a base-Nb electrode makes a significant contribution to the electrical conduction through the PI layer and that a typical current-voltage (I-V) characteristic based on the ideal Josephson junction was obtained even when the number of deposited PI layers was zero. For Au/PI/(Pb–Bi) junctions, typical I-V characteristics of tunnel junctions were obtained at a temperature below the critical temperature of a Pb–Bi superconducting alloy only when the number of deposited layers was 27. © 1990 IOP Publishing Ltd.

引用

页码：116 / 119

页数：4

共 10 条

[1]

de Gennes P. G., 1966, SUPERCONDUCTIVITY ME

[2] A MEASUREMENT OF INDUCED CHARGE IN CNTCNQ LANGMUIR-BLODGETT FILMS SANDWICHED BETWEEN ALUMINUM ELECTRODES [J].