ANALYSIS OF OXYGEN ISOTOPE INTERFACES USING NEGATIVE MOLECULAR ION SIMS

被引：17

作者：

MITCHELL, DF

HUSSEY, RJ

GRAHAM, MJ

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1983年 / 1卷 / 02期

关键词：

D O I：

10.1116/1.572325

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：1006 / 1008

页数：3

共 8 条

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[8] OXYGEN TRACER STUDIES OF THE OXIDATION OF NIOBIUM [J].

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