MORPHOLOGICAL AND STRUCTURAL-PROPERTIES OF HIGH-QUALITY YBCO THIN-FILMS

被引：24
作者：
CASSINESE, A [1 ]
DICHIARA, A [1 ]
GRANOZIO, FM [1 ]
SAIELLO, S [1 ]
DIUCCIO, US [1 ]
VALENTINO, M [1 ]
机构：
[1] UNIV FEDERICO II,DIPARTIMENTO INGN MAT & PRODUZ,NAPLES,ITALY
来源：
JOURNAL OF MATERIALS RESEARCH | 1995年 / 10卷 / 01期
关键词：
D O I：
10.1557/JMR.1995.0011
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
High-quality YBCO thin films have been grown by Inverted Cylindrical Magnetron Sputtering (ICMS) on LaAlO3(100), SrTiO3(100), SrTiO3(110), and MgO(100) substrates. Transition temperaturs of c-axis films exceed 90 K, and transition widths are within 1 K. Critical currents range up to 5 x 10(6) A/cm2 at 77 K. Structural and morphological features analyzed by x-ray diffraction and scanning electron microscopy, respectively, are found to be strongly dependent on film orientation and deposition temperature. In order to understand such dependence, a simple interpretation is proposed in terms of Gibbs energies and growth dynamics of the nucleation process.
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页码：11 / 17
页数：7
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