MORPHOLOGICAL AND STRUCTURAL-PROPERTIES OF HIGH-QUALITY YBCO THIN-FILMS

被引：24

作者：

CASSINESE, A ^{[1
]}

DICHIARA, A ^{[1
]}

GRANOZIO, FM ^{[1
]}

SAIELLO, S ^{[1
]}

DIUCCIO, US ^{[1
]}

VALENTINO, M ^{[1
]}

机构：

[1] UNIV FEDERICO II,DIPARTIMENTO INGN MAT & PRODUZ,NAPLES,ITALY

来源：

JOURNAL OF MATERIALS RESEARCH | 1995年 / 10卷 / 01期

关键词：

D O I：

10.1557/JMR.1995.0011

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

High-quality YBCO thin films have been grown by Inverted Cylindrical Magnetron Sputtering (ICMS) on LaAlO3(100), SrTiO3(100), SrTiO3(110), and MgO(100) substrates. Transition temperaturs of c-axis films exceed 90 K, and transition widths are within 1 K. Critical currents range up to 5 x 10(6) A/cm2 at 77 K. Structural and morphological features analyzed by x-ray diffraction and scanning electron microscopy, respectively, are found to be strongly dependent on film orientation and deposition temperature. In order to understand such dependence, a simple interpretation is proposed in terms of Gibbs energies and growth dynamics of the nucleation process.

引用

页码：11 / 17

页数：7

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