A 4-LEVEL LOGIC ELEMENT UTILIZING OPTICAL BISTABILITY IN A NONCOOLED THIN-FILM SEMICONDUCTOR INTERFEROMETER

被引：0
作者：
BAKIEV, AM
VELIKOVICH, AL
GOLUBEV, GP
LUCHINSKII, DG
机构：
来源：
KVANTOVAYA ELEKTRONIKA | 1987年 / 14卷 / 09期
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：1854 / 1856
页数：3
相关论文
共 10 条
[1]  
APANASEVICH SP, 1984, KVANTOVAYA ELEKTRON+, V11, P1288
[2]   DIFFERENTIAL INTERFEROMETRIC-TECHNIQUE FOR THE MEASUREMENT OF THE NONLINEAR INDEX OF REFRACTION OF RUBY AND GDAIO3-CR-3+ [J].
CATUNDA, T ;
ANDREETA, JP ;
CASTRO, JC .
APPLIED OPTICS, 1986, 25 (14) :2391-2395
[3]  
GOLIK LL, 1981, KVANTOVAYA ELEKTRON+, V8, P2058
[4]  
GOLUBEV GP, 1985, PISMA ZH TEKH FIZ+, V11, P257
[5]   MICROSECOND ROOM-TEMPERATURE OPTICAL BISTABILITY AND CROSSTALK STUDIES IN ZNS AND ZNSE INTERFERENCE FILTERS WITH VISIBLE-LIGHT AND MILLIWATT POWERS [J].
OLBRIGHT, GR ;
PEYGHAMBARIAN, N ;
GIBBS, HM ;
MACLEOD, HA ;
VANMILLIGEN, F .
APPLIED PHYSICS LETTERS, 1984, 45 (10) :1031-1033
[6]   A PULSED THERMOELASTIC ANALYSIS OF PHOTOTHERMAL SURFACE DISPLACEMENTS IN LAYERED MATERIALS [J].
ROUSSET, G ;
BERTRAND, L ;
CIELO, P .
JOURNAL OF APPLIED PHYSICS, 1985, 57 (09) :4396-4405
[7]  
SINITSYN GV, 1986, IF ANBSSR404 PREPR
[8]   OPTICAL BISTABILITY, PHOTONIC LOGIC, AND OPTICAL COMPUTATION [J].
SMITH, SD .
APPLIED OPTICS, 1986, 25 (10) :1550-1564
[9]  
VELIKOVICH AL, 1986, PISMA ZH TEKH FIZ+, V12, P879
[10]  
VELIKOVICH AL, 1987, PISMA ZH TEKH FIZ+, V13, P161
1