PRODUCT QUALITY LEVEL MONITORING AND CONTROL FOR LOGIC CHIPS AND MODULES

This paper defines an absolute number for product defects, called ″product quality level″ (PQL). PQL categories found in logic chips and modules after completion of electrical testing are described and a methodology for the monitoring and control of the PQL in chips is presented. The impact of chip defects on module, card, and system performances is discussed with the aid of examples. By using the described comprehensive design, process control, testing, and user-feedback approach at each assembly level, final product can be manufactured with the lowest possible level of defects that must then be repaired at the machine level.