AN ANALYTICAL REFLECTION AND EMISSION UHV SURFACE ELECTRON-MICROSCOPE

被引：261

作者：

TELIEPS, W ^{[1
]}

BAUER, E ^{[1
]}

机构：

[1] SONDEFORSCH BEREICH 126,GOTTINGEN,FED REP GER

来源：

ULTRAMICROSCOPY | 1985年 / 17卷 / 01期

关键词：

D O I：

10.1016/0304-3991(85)90177-9

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

7

引用

收藏

页码：57 / 65

页数：9

相关论文

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