RHEED STUDY ON THE GE/SI(111) AND SI/GE(111) SYSTEMS - REACTION OF GE WITH THE SI(111)(7X7) SURFACE

被引：77

作者：

ICHIKAWA, T ^{[1
]}

INO, S ^{[1
]}

机构：

[1] UNIV TOKYO,FAC SCI,DEPT PHYS,TOKYO 113,JAPAN

来源：

SURFACE SCIENCE | 1984年 / 136卷 / 2-3期

关键词：

D O I：

10.1016/0039-6028(84)90611-3

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：267 / 284

页数：18

共 11 条

[1] 7X7 RECONSTRUCTION ON SI(111) RESOLVED IN REAL SPACE [J].

BINNIG, G ;

ROHRER, H ;

GERBER, C ;

WEIBEL, E .

PHYSICAL REVIEW LETTERS, 1983, 50 (02) :120-123

[2] SEMICONDUCTOR SURFACES [J].

HANEMAN, D .

ADVANCES IN PHYSICS, 1982, 31 (03) :165-194

[3]

HIGASHIYAMA K, UNPUB PHYS REV LETT

[4] STRUCTURAL STUDY OF SN-INDUCED SUPERSTRUCTURES ON GE(111) SURFACES BY RHEED [J].

ICHIKAWA, T ;

INO, S .

SURFACE SCIENCE, 1981, 105 (2-3) :395-428

[5] DIFFUSE-SCATTERING FROM GE(111) SURFACE AT HIGH-TEMPERATURE [J].

ICHIKAWA, T ;

INO, S .

SOLID STATE COMMUNICATIONS, 1980, 34 (05) :349-353

[6] SOME NEW TECHNIQUES IN REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION (RHEED) APPLICATION TO SURFACE-STRUCTURE STUDIES [J].

INO, S .

JAPANESE JOURNAL OF APPLIED PHYSICS, 1977, 16 (06) :891-908

[7] AN INVESTIGATION OF THE SI(111) 7X7 SURFACE-STRUCTURE BY RHEED [J].

INO, S .

JAPANESE JOURNAL OF APPLIED PHYSICS, 1980, 19 (07) :1277-1290

[8] CHEMICAL-ANALYSIS OF SURFACE BY FLUORESCENT X-RAY SPECTROSCOPY USING RHEED-SSD METHOD [J].

INO, S ;

ICHIKAWA, T ;

OKADA, S .

JAPANESE JOURNAL OF APPLIED PHYSICS, 1980, 19 (08) :1451-1457

[9] SI (111) 7X7 SURFACE-STRUCTURE - CALCULATIONS OF LEED INTENSITY AND COMPARISON WITH EXPERIMENT [J].

LEVINE, JD ;

MCFARLANE, SH ;

MARK, P .

PHYSICAL REVIEW B, 1977, 16 (12) :5415-5425

[10] PSEUDOMORPHIC STRUCTURE AT THE INTERFACE OF GE ON SI(111) STUDIED BY HIGH-ENERGY-ION SCATTERING [J].

NARUSAWA, T ;

GIBSON, WM .

PHYSICAL REVIEW LETTERS, 1981, 47 (20) :1459-1462

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