POSSIBILITIES OF X-RAY INTERFERENCE DIFFRACTOMETRY FOR THE INVESTIGATION OF ION-DOPED LAYERS

被引：9
|
作者：
ARISTOV, VV [1 ]
MORDKOVICH, VN [1 ]
NIKULIN, AY [1 ]
SNIGIREV, AA [1 ]
WINTER, U [1 ]
EROKHIN, YN [1 ]
ZAUMSEIL, P [1 ]
机构：
[1] ACAD SCI GDR,INST SEMICONDUCT PHYS,O-1200 FRANKFURT,GERMANY
来源：
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1990年 / 120卷 / 01期
关键词：
D O I：
10.1002/pssa.2211200127
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
[No abstract available]
引用
收藏
页码：K1 / K5
页数：5
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