ANALYSIS OF SURFACE PROCESSES ON SOLID ELECTRONS BY COMBINED MODULATED ELLIPSOMETRIC AND REFLECTOMETRIC EXPERIMENTS

被引：8

作者：

GOTTESFELD, S ^{[1
]}

BABAI, M ^{[1
]}

REICHMAN, B ^{[1
]}

机构：

[1] TEL AVIV UNIV,DEPT CHEM,TEL AVIV,ISRAEL

来源：

SURFACE SCIENCE | 1976年 / 57卷 / 01期

关键词：

D O I：

10.1016/0039-6028(76)90181-3

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：251 / 265

页数：15

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[7] MONITORING OF FAST CHANGES IN OPTICAL-PROPERTIES OF ELECTRODE SURFACES WITH A CLASSICAL ELLIPSOMETER [J].

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[9]

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