STUDY OF MINERALS BY HIGH-RESOLUTION ELECTRON-MICROSCOPY

被引：0

|

作者：

MORIMOTO, N ^{[1
]}

机构：

[1] OSAKA UNIV,INST SCI IND RES,OSAKA,JAPAN

来源：

JOURNAL OF ELECTRON MICROSCOPY | 1976年 / 25卷 / 01期

关键词：

D O I：

暂无

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

收藏

页码：56 / 56

页数：1

相关论文

共 50 条

[1] ASPECTS OF HIGH-RESOLUTION ELECTRON-MICROSCOPY OF MINERALS
BUSECK, PR
IIJIMA, S
AMERICAN MINERALOGIST, 1974, 59 (9-10) : 1131 - 1132
[2] DEFECTS IN MINERALS AS OBSERVED WITH HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY
BUSECK, PR
VEBLEN, DR
BULLETIN DE MINERALOGIE, 1981, 104 (2-3): : 249 - 260
[3] HIGH-RESOLUTION ELECTRON-MICROSCOPY OF SOME MINERALS OF LAYER SILICATE
IIJIMA, S
JOURNAL OF ELECTRON MICROSCOPY, 1983, 32 (01): : 69 - 69
[4] RESOLUTION IN HIGH-RESOLUTION ELECTRON-MICROSCOPY
OKEEFE, MA
ULTRAMICROSCOPY, 1992, 47 (1-3) : 282 - 297
[5] HIGH-RESOLUTION ELECTRON-MICROSCOPY
COWLEY, JM
ANNUAL REVIEW OF PHYSICAL CHEMISTRY, 1987, 38 : 57 - 88
[6] HIGH-RESOLUTION ELECTRON-MICROSCOPY STUDY OF BELITE
WANG, YG
ZOU, BS
KUO, KH
FENG, XJ
WANG, L
LONG, SZ
JOURNAL OF MATERIALS SCIENCE, 1989, 24 (03) : 877 - 880
[7] HIGH-RESOLUTION ELECTRON-MICROSCOPY
HASHIMOTO, H
ULTRAMICROSCOPY, 1984, 12 (1-2) : 90 - 90
[8] HIGH-RESOLUTION ELECTRON-MICROSCOPY STUDY OF GEASSE
SIEGRIST, T
WESSICKEN, R
MATERIALS RESEARCH BULLETIN, 1982, 17 (03) : 351 - 354
[9] HIGH-RESOLUTION ELECTRON-MICROSCOPY
SMITH, DJ
HELVETICA PHYSICA ACTA, 1983, 56 (1-3): : 463 - 477
[10] HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY APPLIED TO CLAY-MINERALS
GUTHRIE, GD
VEBLEN, DR
ACS SYMPOSIUM SERIES, 1989, 415 : 75 - 93

← 1 2 3 4 5 →