ION DISCRIMINATION EFFECTS IN THE LASER MICROPROBE MASS ANALYZER

被引：0
|
作者：
MICHIELS, E [1 ]
DEWOLF, M [1 ]
GIJBELS, R [1 ]
机构：
[1] UNIV ANTWERP,DEPT CHEM,B-2610 ANTWERP WILRIJK,BELGIUM
来源：
SCANNING ELECTRON MICROSCOPY | 1985年
关键词：
D O I：
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中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
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页码：947 / 958
页数：12
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