IMAGING OF SINGLE ATOMS WITH ELECTRON MICROSCOPE BY PHASE CONTRAST

[1] BORN M, 1959, PRINCIPLES OPTICS, pCH9

[2] BORN M, 1959, PRINCIPLES OPTICS, pCH8

[3] NUMERICAL EVALUATION OF ELECTRON IMAGE PHASE CONTRAST [J]. BELL SYSTEM TECHNICAL JOURNAL, 1965, 44 (02): : 207 - &

[4] HEIDENREICH RD, 1964, FUNDAMENTALS TRANSMI, pCH5

[5] ATOMIC SCATTERING AMPLITUDES FOR ELECTRON DIFFRACTION [J]. ACTA CRYSTALLOGRAPHICA, 1954, 7 (05): : 405 - 408

[6] IBERS JA, 1962, INTERNATIONAL CRYSTA, V3

[7] IMAGING PROPERTIES OF A SERIES OF MAGNETIC ELECTRON LENSES [J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1951, 64 (383): : 956 - 971

[8] THE SYMMETRICAL MAGNETIC ELECTRON MICROSCOPE OBJECTIVE LENS WITH LOWEST SPHERICAL ABERRATION [J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1951, 64 (383): : 972 - 977

[9] LONSDALE K, 1962, INTERNATIONAL CRYSTA, V3, P234

[10] THE THEORETICAL RESOLUTION LIMIT OF THE ELECTRON MICROSCOPE [J]. JOURNAL OF APPLIED PHYSICS, 1949, 20 (01) : 20 - 29

[1] BORN M, 1959, PRINCIPLES OPTICS, pCH9

[2] BORN M, 1959, PRINCIPLES OPTICS, pCH8

[3] NUMERICAL EVALUATION OF ELECTRON IMAGE PHASE CONTRAST [J]. BELL SYSTEM TECHNICAL JOURNAL, 1965, 44 (02): : 207 - &

[4] HEIDENREICH RD, 1964, FUNDAMENTALS TRANSMI, pCH5

[5] ATOMIC SCATTERING AMPLITUDES FOR ELECTRON DIFFRACTION [J]. ACTA CRYSTALLOGRAPHICA, 1954, 7 (05): : 405 - 408

[6] IBERS JA, 1962, INTERNATIONAL CRYSTA, V3

[7] IMAGING PROPERTIES OF A SERIES OF MAGNETIC ELECTRON LENSES [J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1951, 64 (383): : 956 - 971

[8] THE SYMMETRICAL MAGNETIC ELECTRON MICROSCOPE OBJECTIVE LENS WITH LOWEST SPHERICAL ABERRATION [J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1951, 64 (383): : 972 - 977

[9] LONSDALE K, 1962, INTERNATIONAL CRYSTA, V3, P234

[10] THE THEORETICAL RESOLUTION LIMIT OF THE ELECTRON MICROSCOPE [J]. JOURNAL OF APPLIED PHYSICS, 1949, 20 (01) : 20 - 29