THE SCANNING DIELECTRIC MICROSCOPE

被引:34
作者
ASAMI, K
机构
[1] Institute for Chemical Research, Kyoto University, Uji, Kyoto
关键词
D O I
10.1088/0957-0233/5/5/020
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This article describes a new instrument to image the local capacitance (or permittivity) and conductance (or conductivity) of colloidal particles and membranes in an aqueous environment. Capacitance and conductance are measured by the three-terminal (guarded electrode) method with a coaxial probe electrode, which is laterally scanned over samples on a plate electrode. The images of capacitance and conductance are obtained at frequencies between 1 kHz and 10 MHz, which enables the study of dielectric relaxation of individual particles and local areas of membranes.
引用
收藏
页码:589 / 592
页数:4
相关论文
共 14 条
[1]  
ASAMI K, 1994, IN PRESS COLLOID POL
[2]   ATOMIC FORCE MICROSCOPE [J].
BINNIG, G ;
QUATE, CF ;
GERBER, C .
PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933
[3]   SURFACE STUDIES BY SCANNING TUNNELING MICROSCOPY [J].
BINNING, G ;
ROHRER, H ;
GERBER, C ;
WEIBEL, E .
PHYSICAL REVIEW LETTERS, 1982, 49 (01) :57-61
[4]   SCANNING CAPACITANCE MICROSCOPY [J].
BUGG, CD ;
KING, PJ .
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1988, 21 (02) :147-151
[5]  
GRANT EH, 1978, DIELECTRIC BEHAVIOUR
[6]   THE NUMBER OF INTERFACES AND THE ASSOCIATED DIELECTRIC RELAXATIONS IN HETEROGENEOUS SYSTEMS [J].
HANAI, T ;
ZHANG, HZ ;
SEKINE, K ;
ASAKA, K ;
ASAMI, K .
FERROELECTRICS, 1988, 86 :191-204
[7]  
Hanai T., 1968, EMULSION SCI, P353
[8]   THE SCANNING ION-CONDUCTANCE MICROSCOPE [J].
HANSMA, PK ;
DRAKE, B ;
MARTI, O ;
GOULD, SAC ;
PRATER, CB .
SCIENCE, 1989, 243 (4891) :641-643
[9]   SCANNING CAPACITANCE MICROSCOPY [J].
MATEY, JR ;
BLANC, J .
JOURNAL OF APPLIED PHYSICS, 1985, 57 (05) :1437-1444
[10]  
PETHIG R, 1979, DIELECTRIC ELECTRONI