ON THE APPLICATIONS OF PHASE TYPE DISTRIBUTION TO A COMPLEX 2-UNIT STANDBY REDUNDANT SYSTEM

被引：2

作者：

GURURAJAN, M

NATARAJAN, R

CHANDRASEKHAR, P

机构：

[1] MADRAS CHRISTIAN COLL, MADRAS 600059, TAMIL NADU, INDIA

[2] LOYOLA COLL, MADRAS, INDIA

来源：

MICROELECTRONICS RELIABILITY | 1986年 / 26卷 / 03期

关键词：

D O I：

10.1016/0026-2714(86)90289-1

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：443 / 446

页数：4

相关论文

共 18 条

[1] SOME APPLICATIONS OF REGENERATIVE STOCHASTIC-PROCESSES TO RELIABILITY THEORY .2. RELIABILITY AND AVAILABILITY OF 2-ITEM REDUNDANT SYSTEMS
BIROLINI, A
[J]. IEEE TRANSACTIONS ON RELIABILITY, 1975, 24 (05) : 336 - 340
[2] RELIABILITY ANALYSIS OF SYSTEMS COMPRISED OF UNITS WITH ARBITRARY REPAIR-TIME DISTRIBUTIONS
BRANSON, MH
SHAH, B
[J]. IEEE TRANSACTIONS ON RELIABILITY, 1971, R 20 (04) : 217 - +
[3] GNEDENKO BV, 1964, ENG CYBER, V2, P1
[4] RELIABILITY PREDICTION TECHNIQUES FOR COMPLEX SYSTEMS
HTUN, LT
[J]. IEEE TRANSACTIONS ON RELIABILITY, 1966, R 15 (02) : 58 - +
[5] LINTON DG, 1972, IEEE T RELIAB, VR 22, P105
[6] RELIABILITY OF A SYSTEM HAVING STANDBY SPARE PLUS MULTIPLE-REPAIR CAPABILITY
MUTH, EJ
[J]. IEEE TRANSACTIONS ON RELIABILITY, 1966, R 15 (02) : 76 - &
[7] STOCHASTIC BEHAVIOR OF A 2-DISSIMILAR-UNIT STANDBY REDUNDANT SYSTEM WITH REPAIR MAINTENANCE
NAKAGAWA, T
OSAKI, S
[J]. MICROELECTRONICS AND RELIABILITY, 1974, 13 (02): : 143 - 148
[8] NAKAGAWA T, 1974, INFOR, V12, P66
[9] Neuts M. F., 1981, OR Spektrum, V2, P227, DOI 10.1007/BF01721011
[10] Neuts MF, 1975, PROBABILITY DISTRIBU, P173