A METHOD FOR DETERMINING BAND OFFSETS IN SEMICONDUCTOR SUPERLATTICES AND INTERFACES

被引：29

作者：

BASS, JM

OLOUMI, M

MATTHAI, CC

机构：

来源：

JOURNAL OF PHYSICS-CONDENSED MATTER | 1989年 / 1卷 / 51期

关键词：

D O I：

10.1088/0953-8984/1/51/032

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

页码：10625 / 10628

页数：4

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