BOUNDING SIGNAL PROBABILITIES IN COMBINATIONAL-CIRCUITS

被引：0

|

作者：

MARKOWSKY, G

机构：

来源：

IEEE TRANSACTIONS ON COMPUTERS | 1987年 / 36卷 / 10期

关键词：

D O I：

暂无

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

收藏

页码：1247 / 1251

页数：5

相关论文

共 50 条

[1] THE CALCULATION OF SIGNAL STABLE RANGES IN COMBINATIONAL-CIRCUITS
LIU, LR
CHEN, HC
DU, DHC
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 1994, 13 (08) : 1016 - 1023
[2] TIGHT LOWER BOUNDS ON THE DETECTION PROBABILITIES OF SINGLE FAULTS AT INTERNAL SIGNAL LINES IN COMBINATIONAL-CIRCUITS
ALI, SA
REDINBO, GR
IEEE TRANSACTIONS ON COMPUTERS, 1994, 43 (12) : 1426 - 1428
[3] STUDYING THE CONTROLLABILITY OF COMBINATIONAL-CIRCUITS
SKOBELEV, VG
AUTOMATION AND REMOTE CONTROL, 1988, 49 (01) : 109 - 113
[4] GRAPHICAL REPRESENTATION OF COMBINATIONAL-CIRCUITS
ZAKREVSKIJ, AD
AVTOMATIKA I VYCHISLITELNAYA TEKHNIKA, 1990, (06): : 59 - 65
[5] ANALYSIS OF CYCLIC COMBINATIONAL-CIRCUITS
MALIK, S
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 1994, 13 (07) : 950 - 956
[6] RING TESTING OF COMBINATIONAL-CIRCUITS
LITIKOV, IP
AUTOMATION AND REMOTE CONTROL, 1983, 44 (07) : 949 - 955
[7] IDENTIFICATION OF UNDETECTABLE FAULTS IN COMBINATIONAL-CIRCUITS
HARIHARA, M
MENON, PR
PROCEEDINGS - IEEE INTERNATIONAL CONFERENCE ON COMPUTER DESIGN : VLSI IN COMPUTERS & PROCESSORS, 1989, : 290 - 293
[8] ON DELAY FAULT TESTING IN COMBINATIONAL-CIRCUITS
ANTREICH, KJ
FUCHS, K
FINK, F
FREQUENZ, 1990, 44 (3-4) : 103 - 111
[9] ANALYSIS OF SIGNATURE TESTABILITY OF COMBINATIONAL-CIRCUITS
DJACHENKO, ON
AVTOMATIKA I VYCHISLITELNAYA TEKHNIKA, 1990, (05): : 85 - 89
[10] REDUNDANCY IDENTIFICATION AND REMOVAL IN COMBINATIONAL-CIRCUITS
MENON, PR
AHUJA, H
HARIHARA, M
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 1994, 13 (05) : 646 - 651

← 1 2 3 4 5 →