PARAMETER-ESTIMATION OF FREQUENCY-DEPENDENT SCATTERERS USING SUPERRESOLUTION TECHNIQUES

被引：1
|
作者：
ODENDAAL, JW
VANJAARSVELD, PA
机构：
[1] Department of Electrical and Electronic Engineering, University of Pretoria, Pretoria
来源：
MICROWAVE AND OPTICAL TECHNOLOGY LETTERS | 1995年 / 10卷 / 02期
关键词：
SUPERRESOLUTION ESTIMATION; FREQUENCY-DEPENDENT SCATTERERS;
D O I：
10.1002/mop.4650100202
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A technique to estimate the frequency dependence of electromagnetic scattering centers is proposed. The technique employs a superresolution algorithm to estimate poles corresponding to the various scattering centers contributing to the total backscattered field. A relationship between the amplitudes of the estimated poles and the frequency dependence of the scatterers is derived. The technique is applied to estimate the frequency dependence of simulated and measured backscattered field data. (C) 1995 John Wiley & Sons, Inc.
引用
收藏
页码：71 / 74
页数：4
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