EFFECTS OF OXYGEN AND DOPANT ON LIFETIME IN NEUTRON-IRRADIATED SILICON

被引:49
作者
CURTIS, OL
机构
关键词
D O I
10.1109/TNS.1996.4324343
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:33 / +
页数:1
相关论文
共 15 条
[11]   EFFECTS OF DOSAGE + IMPURITIES ON RADIATION DAMAGE OF CARRIER LIFE TIME IN SI [J].
NAKANO, T ;
INUISHI, Y .
JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1964, 19 (06) :851-&
[12]  
Pauling L., 1960, NATURE CHEM BOND, P246
[13]   SPIN RESONANCE IN ELECTRON IRRADIATED SILICON [J].
WATKINS, GD ;
CORBETT, JW ;
WALKER, RM .
JOURNAL OF APPLIED PHYSICS, 1959, 30 (08) :1198-1203
[14]   DEFECTS IN IRRADIATED SILICON .1. ELECTRON SPIN RESONANCE OF SI-A CENTER [J].
WATKINS, GD ;
CORBETT, JW .
PHYSICAL REVIEW, 1961, 121 (04) :1001-&
[15]   ELECTRON PARAMAGNETIC RESONANCE OF DEFECTS IN IRRADIATED SILICON [J].
WATKINS, GD ;
CORBETT, JW .
DISCUSSIONS OF THE FARADAY SOCIETY, 1961, (31) :86-&