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- [3] DETERMINATION OF FOIL THICKNESS BY SCANNING-TRANSMISSION ELECTRON-MICROSCOPY PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1975, 31 (02): : 771 - 780
- [4] COMMENTS ON THE MEASUREMENT OF FOIL THICKNESS BY CONVERGENT BEAM ELECTRON-DIFFRACTION SCRIPTA METALLURGICA, 1986, 20 (07): : 1001 - 1006
- [5] THICKNESS AND PROFILE OF A WEDGE-SHAPED FOIL FOR TRANSMISSION ELECTRON-MICROSCOPY MATERIALS SCIENCE AND ENGINEERING, 1985, 69 (01): : L5 - L8
- [6] INCREASE IN USABLE FOIL THICKNESS IN SCANNING-TRANSMISSION ELECTRON-MICROSCOPY PHILOSOPHICAL MAGAZINE, 1975, 31 (01): : 225 - 228
- [7] INTERACTION OF THICKNESS EXTINCTION CONTOURS AND DISLOCATIONS IN WEAK-BEAM ELECTRON-MICROSCOPY ACTA CRYSTALLOGRAPHICA SECTION A, 1975, 31 : S262 - S262
- [8] ELECTRON-MICROSCOPY WITH CONVERGENT BEAM - OBSERVATION OF DISLOCATION PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1980, 60 (01): : 209 - 214
- [9] ANALYSIS OF INTERACTION OF THICKNESS EXTINCTION CONTOURS AND DISLOCATIONS IN WEAK-BEAM ELECTRON-MICROSCOPY PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1975, 29 (02): : 623 - 634
- [10] STEREOSCOPIC FOIL THICKNESS DETERMINATION IN TRANSMISSION ELECTRON MICROSCOPY JERNKONTORETS ANNALER, 1971, 155 (08): : 465 - &