CU0, CU+, AND CU-2 FROM EXCIMER-ABLATED COPPER

被引:144
作者
DREYFUS, RW
机构
[1] IBM Research Division, T. J. Watson Research Center, Yorktown Heights
关键词
D O I
10.1063/1.347218
中图分类号
O59 [应用物理学];
学科分类号
摘要
Bulk copper is laser etched with 193- and 351-nm excimer radiation. The transition from the thermal to the plasma etch region is studied by measuring the the densities and kinetic energies of three copper species (Cu0, Cu+, and Cu2) in the etch plume. A unique laser-induced fluorescence experiment allows these three species to be followed essentially simultaneously as a function of fluence. Three separate types of etching behavior are clearly evident (even within the small fluence range of approximately 1-12.5 J/cm2); i.e., ionization of the Cu vapor, and electron-atom collision-induced ionization (breakdown) and dissociation (of Cu2).
引用
收藏
页码:1721 / 1729
页数:9
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