USES AND ABUSES OF DIAGNOSTIC ELECTRON-MICROSCOPY

被引：0
作者：
ALMEIDA, JD
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来源：
CURRENT TOPICS IN MICROBIOLOGY AND IMMUNOLOGY | 1983年 / 104卷
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中图分类号：
R392 [医学免疫学]; Q939.91 [免疫学];
学科分类号：
100102 ;
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页码：147 / 158
页数：12
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