EVALUATION OF ELECTRICALLY POLAR SUBSTANCES BY ELECTRIC SCANNING FORCE MICROSCOPY .1. MEASUREMENT SIGNALS DUE TO MAXWELL STRESS

被引：68
作者：
FRANKE, K
WEIHNACHT, M
机构：
[1] IFW Dresden e. V., Postfach, D-01171, Dresden
来源：
FERROELECTRICS LETTERS SECTION | 1995年 / 19卷 / 1-2期
关键词：
D O I：
10.1080/07315179508205938
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
The electric scanning force microscope (EFM) is used for the high-resolution characterization of electrically polar substances. An EFM is considered, the tip of which is electrically conductive and has a given potential. The tip of the EFM is exposed to Maxwell stress caused by ferroelectric domains and sample permittivity. This Maxwell stress is analytically calculated in a one-dimensional model. The results of calculation are compared with the results of EFM measurements. The method for measuring ferroelectric domains is in particular discussed.
引用
收藏
页码：25 / 33
页数：9
相关论文
共 10 条
[1]   FREQUENCY-MODULATION DETECTION USING HIGH-Q CANTILEVERS FOR ENHANCED FORCE MICROSCOPE SENSITIVITY [J].
ALBRECHT, TR ;
GRUTTER, P ;
HORNE, D ;
RUGAR, D .
JOURNAL OF APPLIED PHYSICS, 1991, 69 (02) :668-673
[2]   DEPOSITION OF FERROELECTRIC PZT THIN-FILMS BY PLANAR MULTITARGET SPUTTERING [J].
BRUCHHAUS, R ;
HUBER, H ;
PITZER, D ;
WERSING, W .
FERROELECTRICS, 1992, 127 (1-4) :137-142
[3]  
FRANKE K, UNPUB FERROELECTRICS
[4]  
GUTHNER P, 1992, THESIS U KONSTANZ GE
[5]  
Lemanov V. V., 1993, Technical Physics Letters, V19, P24
[6]  
LINES ME, 1979, PRINCIPLES APPLICATI
[7]   SURFACE AND DOMAIN-STRUCTURES OF FERROELECTRIC-CRYSTALS STUDIED WITH SCANNING FORCE MICROSCOPY [J].
LUTHI, R ;
HAEFKE, H ;
MEYER, KP ;
MEYER, E ;
HOWALD, L ;
GUNTHERODT, HJ .
JOURNAL OF APPLIED PHYSICS, 1993, 74 (12) :7461-7471
[8]   IMAGING OF FERROELECTRIC DOMAIN-WALLS BY FORCE MICROSCOPY [J].
SAURENBACH, F ;
TERRIS, BD .
APPLIED PHYSICS LETTERS, 1990, 56 (17) :1703-1705
[9]  
Sessler G, 1987, ELECTRETS TOPICS APP, V33
[10]  
[No title captured]
1