STOCHASTIC-ANALYSIS OF A 2 UNIT COLD STANDBY SYSTEM WITH PREPARATION TIME FOR REPAIR

被引：14
作者：
SINGH, SK
SRINIVASU, B
机构：
[1] Ravishankar Univ, Raipur, India, Ravishankar Univ, Raipur, India
来源：
MICROELECTRONICS AND RELIABILITY | 1987年 / 27卷 / 01期
关键词：
D O I：
10.1016/0026-2714(87)90620-2
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
5
引用
收藏
页码：55 / 60
页数：6
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[2]   COMPARISON OF 2 UNIT COLD STANDBY RELIABILITY MODELS WITH 3 TYPES OF REPAIR FACILITIES [J].
MURARI, K ;
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[3]   STOCHASTIC BEHAVIOR OF A 2-UNIT PRIORITY STANDBY REDUNDANT SYSTEM WITH REPAIR [J].
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OSAKI S, 1977, MICROELECTRON RELIAB, V16, P14
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