NON-LINEAR HIGH-RESOLUTION IMAGE-PROCESSING OF CONVENTIONAL TRANSMISSION ELECTRON-MICROGRAPHS .1. THEORY

被引:29
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KIRKLAND, EJ
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10.1016/0304-3991(82)90228-5
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TH742 [显微镜];
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页码:45 / 64
页数:20
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[1]  
Acton F.S., 1970, NUMERICAL METHODS WO
[2]   BEAM LATTICE IMAGES .1. EXPERIMENTAL AND COMPUTED IMAGES FROM W4NB26O77 [J].
ALLPRESS, JG ;
HEWAT, EA ;
MOODIE, AF ;
SANDERS, JV .
ACTA CRYSTALLOGRAPHICA SECTION A, 1972, A 28 (NOV1) :528-536
[3]   NBEAM LATTICE IMAGES .3. UPPER LIMITS OF IONICITY IN W4NB26O77 [J].
ANSTIS, GR ;
LYNCH, DF ;
MOODIE, AF ;
OKEEFE, MA .
ACTA CRYSTALLOGRAPHICA SECTION A, 1973, A 29 (MAR1) :138-&
[4]  
Castleman K. R., 1979, DIGITAL IMAGE PROCES
[5]   THE SCATTERING OF ELECTRONS BY ATOMS AND CRYSTALS .1. A NEW THEORETICAL APPROACH [J].
COWLEY, JM ;
MOODIE, AF .
ACTA CRYSTALLOGRAPHICA, 1957, 10 (10) :609-619
[6]  
COWLEY JM, 1975, PHYSICAL ASPECTS ELE, P3
[7]   RELATIVISTIC HARTREE-FOCK X-RAY AND ELECTRON SCATTERING FACTORS [J].
DOYLE, PA ;
TURNER, PS .
ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1968, A 24 :390-&
[8]   IMAGING OF SINGLE ATOMS WITH ELECTRON MICROSCOPE BY PHASE CONTRAST [J].
EISENHANDLER, CB ;
SIEGEL, BM .
JOURNAL OF APPLIED PHYSICS, 1966, 37 (04) :1613-+
[9]   A ZONE-PLATE APERTURE FOR ENHANCING RESOLUTION IN PHASE-CONTRAST ELECTRON MICROSCOPY - (COMPUTER EVALUATION - SINGLE-ATOM IMAGING-ELECTRON MICROSCOPE DESIGN - T) [J].
EISENHANDLER, CB ;
SIEGEL, BM .
APPLIED PHYSICS LETTERS, 1966, 8 (10) :258-+
[10]  
Erickson H. P., 1973, ADV OPT ELECT MICROS, V5, P163