DETERMINATION OF THE RARE-EARTH ELEMENTS IN GEOLOGICAL-MATERIALS BY THIN-FILM X-RAY-FLUORESCENCE AND INDUCTIVELY-COUPLED PLASMA ATOMIC-EMISSION SPECTROMETRY

被引：20

作者：

HOU, QL ^{[1
]}

HUGHES, TC ^{[1
]}

HAUKKA, M ^{[1
]}

HANNAKER, P ^{[1
]}

机构：

[1] UNIV MELBOURNE,SCH EARTH SCI,DEPT GEOL,PARKVILLE,VIC 3052,AUSTRALIA

来源：

TALANTA | 1985年 / 32卷 / 06期

关键词：

D O I：

10.1016/0039-9140(85)80263-0

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：495 / 499

页数：5

共 20 条

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[8] DETERMINATION OF RARE-EARTH ELEMENTS IN GEOLOGICAL-MATERIALS BY INDUCTIVELY COUPLED ARGON PLASMA ATOMIC EMISSION-SPECTROMETRY [J].

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[9] DETERMINATION OF RARE-EARTH, YTTRIUM, AND SCANDIUM ABUNDANCES IN ROCKS AND MINERALS BY AN ION EXCHANGE X-RAY FLUORESCENCE PROCEDURE [J].

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[10] RARE-EARTH EVIDENCE IN IRON-FORMATIONS FOR CHANGING PRECAMBRIAN OXIDATION-STATES [J].

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