A NEW METHOD FOR SURFACE-ANALYSIS OF CRYSTALS USING X-RAY-DIFFRACTION UNDER THE SPECULAR REFLECTION CONDITIONS

被引：29

作者：

ALEKSANDROV, PA ^{[1
]}

AFANASEV, AM ^{[1
]}

GOLOVIN, AL ^{[1
]}

IMAMOV, RM ^{[1
]}

NOVIKOV, DV ^{[1
]}

STEPANOV, SA ^{[1
]}

机构：

[1] ACAD SCI USSR,INST CRYSTALLOG,MOSCOW 117333,USSR

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1985年 / 18卷 / FEB期

关键词：

X-RAYS; -; Diffraction;

D O I：

10.1107/S0021889885009712

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

A new method is suggested for simultaneous determination of small misorientations of the surface from the chosen crystallographic plane and the thickness of the surface amorphous layer. The method is based on X-ray diffraction experiments under specular reflection conditions. The method provides detection of layers approx. 5 A in thickness, which seems to be unique for X-ray diffraction methods.

引用

页码：27 / 32

页数：6

共 7 条

[1] X-RAY-DIFFRACTION UNDER SPECULAR REFLECTION CONDITIONS - IDEAL CRYSTALS [J].