OBSERVATION THROUGH SURFACE-COATINGS OF DOMAIN-STRUCTURE IN 3-PERCENT SI-FE SHEET BY A HIGH-VOLTAGE SCANNING ELECTRON-MICROSCOPE

被引:15
作者
FUKUDA, B
IRIE, T
SHIMANAKA, H
YAMAMOTO, T
机构
[1] KAWASAKI STEEL CORP,RES LABS,CHIBA 280,JAPAN
[2] JEOL LTD,TOKYO 196,JAPAN
关键词
D O I
10.1109/TMAG.1977.1059605
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:1499 / 1504
页数:6
相关论文
共 16 条
[1]   DYNAMIC MAGNETOSTRICTION AND MECHANICAL STRAIN IN ORIENTED 3 PER CENT SILICON-IRON SHEET SUBJECT TO COMBINED LONGITUDINAL AND TRANSVERSE STRESSES [J].
BANKS, PJ ;
RAWLINSON, E .
PROCEEDINGS OF THE INSTITUTION OF ELECTRICAL ENGINEERS-LONDON, 1967, 114 (10) :1537-+
[2]   DOMAIN PATTERN IN SILICON-IRON UNDER STRESS [J].
DIJKSTRA, LJ ;
MARTIUS, UM .
REVIEWS OF MODERN PHYSICS, 1953, 25 (01) :146-150
[3]   MAGNETIC DOMAIN CONTRAST FROM CUBIC MATERIALS IN SCANNING ELECTRON-MICROSCOPE [J].
FATHERS, DJ ;
JAKUBOVICS, JP ;
JOY, DC .
PHILOSOPHICAL MAGAZINE, 1973, 27 (03) :765-768
[4]   NEW METHOD OF OBSERVING MAGNETIC DOMAINS BY SCANNING ELECTRON-MICROSCOPY .2. EXPERIMENTAL CONFIRMATION OF THEORY OF IMAGE-CONTRAST [J].
FATHERS, DJ ;
JAKUBOVICS, JP ;
JOY, DC ;
NEWBURY, DE ;
YAKOWITZ, H .
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1974, 22 (02) :609-619
[5]  
GOTO I, 1975, EPS C P CARDIFF
[6]  
IMAI M, 1972, Patent No. 3649372
[7]  
IRIE T, 1975, AIP C P, P574
[8]  
IRIE T, 1976, Patent No. 3930906
[9]   MONTE-CARLO CALCULATIONS OF MAGNETIC CONTRAST FROM CUBIC MATERIALS IN SCANNING ELECTRON-MICROSCOPE [J].
NEWBURY, DE ;
YAKOWITZ, H ;
MYKLEBUST, RL .
APPLIED PHYSICS LETTERS, 1973, 23 (08) :488-490
[10]  
Philbert J., 1969, MICRON, V1, P174