A MICROPROCESSOR-BASED DUAL SLOPE PHASE METER

被引：15
作者：
MAHMUD, SM
RUSEK, A
GANESAN, S
机构：
[1] Oakland Univ, Rochester, MI, USA
来源：
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 1988年 / 37卷 / 03期
关键词：
COMPUTERS; MICROCOMPUTER; --; Applications;
D O I：
10.1109/19.7458
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A dual-slope phase meter has been designed and tested to investigate its limitations. The design does not require a time standard; it offers good resolution, relative simplicity, low sensitivity to changes of internal circuit parameters, and microprocessor compatibility. The idea is based on a single-slope approach demonstrated by W.T. Davis (1986), but several disadvantages of the system have been eliminated. The main problem with the system, relating to the error due to the finite time of sampling, is discussed.
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收藏
页码：374 / 378
页数：5
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