A HIGH-SPEED LOW-POWER JFET PULL-DOWN ECL CIRCUIT

被引:1
|
作者
SHIN, HJ
LU, PF
CHUANG, CT
机构
[1] IBM Thomas J. Watson Research Center, Yorktown Heights
关键词
6;
D O I
10.1109/4.75075
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
An active pull-down output stage that utilizes a "free" JFET available in any n-p-n bipolar technology, applied to a high-speed low-power ECL circuit, is described. Simulation results based on a 0.8-mu-m, double poly-Si, self-aligned bipolar technology indicate that the circuit with a typical loading at a power consumption of 1 mW per gate offers 24% improvement in the pull-down delay and 53% improvement in the load driving capability compared with the conventional ECL circuit.
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页码:679 / 683
页数:5
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