X-RAY DIFFRACTION TECHNIQUE FOR RAPID SURFACE AREA DETERMINATION

被引：17
|
作者：
KEELY, WM
机构：
来源：
ANALYTICAL CHEMISTRY | 1966年 / 38卷 / 01期
关键词：
D O I：
10.1021/ac60233a046
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
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页码：147 / &
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