Atomic Force Microscopy as a Tool for Research in Oncocytology

被引：0

作者：

Reshetov, I. V. ^{[1
]}

Chissov, V. I. ^{[1
]}

Bykov, V. A. ^{[3
]}

Volchenco, N. N. ^{[1
]}

Sukharev, S. S. ^{[1
]}

Slavnova, E. N. ^{[1
]}

Ivanov, Yu. S. ^{[2
]}

机构：

[1] PA Hertzen Moscow Res Oncol Inst, Moscow, Russia

[2] Moscow State Tech Univ, Moscow, Russia

[3] NT MDT Co, Beijing, Peoples R China

来源：

NANOTECH CONFERENCE & EXPO 2009, VOL 2, TECHNICAL PROCEEDINGS: NANOTECHNOLOGY 2009: LIFE SCIENCES, MEDICINE, DIAGNOSTICS, BIO MATERIALS AND COMPOSITES | 2009年

关键词：

nanoparticles; AFM; semicontact mode; cytological specimens;

D O I：

暂无

中图分类号：

Q81 [生物工程学（生物技术）]; Q93 [微生物学];

学科分类号：

071005 ; 0836 ; 090102 ; 100705 ;

摘要：

Most of investigations have studied specimens prepared by complex techniques [1,2] which are unusual for ordinary hospitals. In present paper Atomie Force Microscopy (AFM) has been used for searching signs of malignancy in specimens prepared identically to those used in traditional cytological studies.

引用

页码：18 / +

页数：2