STRUCTURAL RELAXATION FOLLOWING CRYSTALLIZATION IN HIGH-PURITY GEO2 GLASS

Crystallization of high purity GeO2 glass heat treated for various lengths of time at temperatures between 373 and 1273 K was monitored by X-ray diffraction. Structural relaxation at and slightly above room temperature in these partially crystalline samples was studied by electron spin resonance (ESR) spectroscopy as a function of time. Broken bonds are created during the structural relaxation of the glassy phase as evidenced by the increase in the concentration of Ge E' centers.