DOUBLE CRYSTAL SYNCHROTRON X-RAY-DIFFRACTION STUDY OF STOICHIOMETRY IN GALLIUM-ARSENIDE

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作者：
COCKERTON, S
GREEN, GS
TANNER, BK
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CHARACTERIZATION OF THE STRUCTURE AND CHEMISTRY OF DEFECTS IN MATERIALS | 1989年 / 138卷
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T [工业技术];
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08 ;
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页码：65 / 70
页数：6
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