DOUBLE CRYSTAL SYNCHROTRON X-RAY-DIFFRACTION STUDY OF STOICHIOMETRY IN GALLIUM-ARSENIDE

被引：0

作者：

COCKERTON, S

GREEN, GS

TANNER, BK

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来源：

CHARACTERIZATION OF THE STRUCTURE AND CHEMISTRY OF DEFECTS IN MATERIALS | 1989年 / 138卷

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T [工业技术];

学科分类号：

08 ;

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引用

页码：65 / 70

页数：6

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