DAMAGE OF ZEOLITE-Y IN THE TEM AND ITS EFFECTS ON TEM IMAGES

被引：58

作者：

CSENCSITS, R

GRONSKY, R

机构：

来源：

ULTRAMICROSCOPY | 1987年 / 23卷 / 3-4期

关键词：

D O I：

10.1016/0304-3991(87)90253-1

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：421 / 431

页数：11

共 21 条

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