ELLIPSOMETRY AND REFLECTION, LUMINESCENCE AND RAMAN SPECTROSCOPIES OF MONOLAYER ASSEMBLIES ON SOLID SUBSTRATES

被引：18
|
作者：
KNOLL, W [1 ]
RABE, J [1 ]
PHILPOTT, MR [1 ]
SWALEN, JD [1 ]
机构：
[1] IBM CORP,RES LAB,SAN JOSE,CA 95193
来源：
THIN SOLID FILMS | 1983年 / 99卷 / 1-3期
关键词：
D O I：
10.1016/0040-6090(83)90378-4
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：173 / 179
页数：7
相关论文
共 50 条
  • [1] PHOTOTHERMAL SPECTROSCOPY OF DYE-MONOLAYER ASSEMBLIES ON SOLID SUBSTRATES
    KNOLL, W
    COUFAL, HJ
    THIN SOLID FILMS, 1988, 160 (1-2) : 333 - 339
  • [2] Study of Slavic Parchment by Raman and Luminescence Spectroscopies
    D. V. Pankin
    M. V. Korogodina
    A. V. Povolotskaya
    A. A. Mikhailova
    V. G. Podkovyrova
    E. A. Tileva
    I. V. Tseveleva
    A. G. Sergeev
    A. V. Kurochkin
    Optics and Spectroscopy, 2021, 129 : 153 - 160
  • [3] Study of Slavic Parchment by Raman and Luminescence Spectroscopies
    Pankin, D., V
    Korogodina, M., V
    Povolotskaya, A., V
    Mikhailova, A. A.
    Podkovyrova, V. G.
    Tileva, E. A.
    Tseveleva, I., V
    Sergeev, A. G.
    Kurochkin, A., V
    OPTICS AND SPECTROSCOPY, 2021, 129 (01) : 153 - 160
  • [4] Monolayer film analysis by total internal reflection ellipsometry
    Vaicikauskas, V.
    Balevicius, Z.
    LITHUANIAN JOURNAL OF PHYSICS, 2007, 47 (01): : 81 - 85
  • [5] STUDIES OF DEFECTS IN DIAMOND FILMS AND PARTICLES BY LUMINESCENCE AND RAMAN SPECTROSCOPIES
    ROBINS, LH
    FARABAUGH, EN
    FELDMAN, A
    COOK, L
    CARBON, 1990, 28 (06) : 792 - 792
  • [6] Identification of thin films on zinc substrates by FTIR and Raman spectroscopies
    Kasperek, J
    Lenglet, M
    REVUE DE METALLURGIE-CAHIERS D INFORMATIONS TECHNIQUES, 1997, 94 (05): : 713 - 719
  • [7] IR REFLECTION AND RAMAN SPECTROSCOPIES OF THE ANODIC OXIDE-FILMS ON TUNGSTEN
    OHTSUKA, T
    GOTO, N
    SATO, N
    KUNIMATSU, K
    BERICHTE DER BUNSEN-GESELLSCHAFT-PHYSICAL CHEMISTRY CHEMICAL PHYSICS, 1987, 91 (04): : 313 - 316
  • [8] Immobilisation of multilayer bioreceptor assemblies on solid substrates
    Brynda, E
    Houska, M
    Skvor, J
    Ramsden, JJ
    BIOSENSORS & BIOELECTRONICS, 1998, 13 (02): : 165 - 172
  • [9] On the frustration of back-surface reflection from transparent substrates in ellipsometry
    Hayton, DJ
    Jenkins, TE
    MEASUREMENT SCIENCE AND TECHNOLOGY, 2004, 15 (02) : N17 - N20
  • [10] Phosphors characterization by XRD, electron microscopy, micro (-Raman and -luminescence) spectroscopies.
    Dexpert-Ghys, J
    Bedoya, C
    Trombe, JC
    Baules, P
    Kihn, Y
    Zwick, A
    LUMINESCENT MATERIALS VI, 1998, 97 (29): : 56 - 66
12345