ELLIPSOMETRY AND REFLECTION, LUMINESCENCE AND RAMAN SPECTROSCOPIES OF MONOLAYER ASSEMBLIES ON SOLID SUBSTRATES

被引：18
作者：
KNOLL, W [1 ]
RABE, J [1 ]
PHILPOTT, MR [1 ]
SWALEN, JD [1 ]
机构：
[1] IBM CORP,RES LAB,SAN JOSE,CA 95193
来源：
THIN SOLID FILMS | 1983年 / 99卷 / 1-3期
关键词：
D O I：
10.1016/0040-6090(83)90378-4
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：173 / 179
页数：7
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