INVESTIGATION OF THE SURFACE-MORPHOLOGY OF ION-BOMBARDED BIOCOMPATIBLE MATERIALS WITH A SEM AND PROFILOGRAPH

被引:10
|
作者
KOWALSKI, ZW
机构
关键词
D O I
10.1007/BF01026959
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:2845 / 2854
页数:10
相关论文
共 50 条
  • [21] COMPARATIVE SEM STUDY OF STOMATA AND SURFACE-MORPHOLOGY IN APPLE
    BLANKE, MM
    ANGEWANDTE BOTANIK, 1987, 61 (5-6): : 433 - 438
  • [22] SURFACE AND SUB-SURFACE COMPOSITION AND PROPERTIES OF ION-BOMBARDED LITHIUM ALLOYS
    KRAUSS, AR
    GRUEN, DM
    LAM, NQ
    DEWALD, AB
    VALENTINE, MG
    SAGARA, A
    KAMADA, K
    SCANNING MICROSCOPY, 1988, 2 (03) : 1365 - 1373
  • [23] A NOTE ON THE RADIATIVE ENERGY-LOSS FROM AN ION-BOMBARDED SURFACE
    PORADZISZ, A
    SZYMONSKI, M
    DRWIEGA, M
    LIPINSKA, E
    NOWAK, T
    WIERBA, M
    ROTOCKA, K
    LAZARSKI, S
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1988, 45 (02): : 155 - 158
  • [24] TEMPERATURE DEPENDENCE OF SURFACE STRUCTURE OF ION-BOMBARDED SI SINGLE CRYSTALS
    PUNZEL, J
    PHYSICA STATUS SOLIDI, 1967, 24 (01): : K1 - &
  • [25] NOTE ON THE RADIATIVE ENERGY LOSS FROM AN ION-BOMBARDED SURFACE.
    Poradzisz, A.
    Szymonski, M.
    Drwiega, M.
    Lipinska, E.
    Nowak, T.
    Wierba, M.
    Rotocka, K.
    Lazarski, S.
    Applied physics. A, Solids and surfaces, 1988, A45 (02): : 155 - 158
  • [26] Atomic force microscopy investigation of ion-bombarded InP: Effect of angle of ion bombardment
    Demanet, CM
    Sankar, KV
    Malherbe, JB
    SURFACE AND INTERFACE ANALYSIS, 1996, 24 (08) : 503 - 510
  • [27] Atomic force microscopy investigation of ion-bombarded InP: effect of angle of ion bombardment
    Univ of Transkei, Umtata, South Africa
    Surf Interface Anal, 8 (503-510):
  • [28] A SEM STUDY ON THE DEVELOPMENT OF THE VENTRICULAR SURFACE-MORPHOLOGY IN THE DIENCEPHALON OF THE RAT
    LAKKE, EAJF
    VANDERVEEKEN, JGPM
    MENTINK, MMT
    MARANI, E
    ANATOMY AND EMBRYOLOGY, 1988, 179 (01): : 73 - 80
  • [29] SEM SURFACE-MORPHOLOGY OF THE CONTRACTILE CELLS IN THE RAT SEMINIFEROUS TUBULES
    MURAKAMI, M
    HAMASAKI, M
    OKITA, S
    ABE, J
    EXPERIENTIA, 1979, 35 (08): : 1099 - 1101
  • [30] Investigation of ion-bombarded conducting polymer films by scanning electrochemical microscopy (SECM)
    G. Wittstock
    Tim Asmus
    Thomas Wilhelm
    Fresenius' Journal of Analytical Chemistry, 2000, 367 : 346 - 351