BUILT-IN SELF-TEST STRUCTURES AROUND CELLULAR AUTOMATA AND COUNTERS

被引：6
作者：
DAS, AK
PANDEY, M
GUPTA, A
CHAUDHURI, PP
机构：
来源：
IEE PROCEEDINGS-E COMPUTERS AND DIGITAL TECHNIQUES | 1990年 / 137卷 / 04期
关键词：
D O I：
10.1049/ip-e.1990.0033
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
BIST structures for on-chip generation of random, exhaustive and deterministic test patterns have been discussed in the paper. Isomorphism between maximal length LFSR and exhaustive CA has been established and the pseudorandomness properties of CAs in terms of well-suited autocorrelation functions have been investigated. Owing to the regularity in interconnection structure, additive group CA (cellular automata) offers advantages over LFSR. A method of covering deterministic test set by a counter-based scheme and its optimisation based on AT2 complexity has been discussed.
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收藏
页码：269 / 276
页数：8
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