ACTIVATION OF GERMANIUM ACCEPTORS DURING SICL4 REACTIVE-ION ETCHING OF MOCVD GAAS EPITAXIAL LAYERS

被引:0
作者
WEBER, J
SAWYER, WD
HARRIS, CI
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来源
INSTITUTE OF PHYSICS CONFERENCE SERIES | 1990年 / 106期
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O4 [物理学];
学科分类号
0702 ;
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页码:263 / 266
页数:4
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共 10 条
[1]   NATIVE DEFECTS IN GALLIUM-ARSENIDE [J].
BOURGOIN, JC ;
VONBARDELEBEN, HJ ;
STIEVENARD, D .
JOURNAL OF APPLIED PHYSICS, 1988, 64 (09) :R65-R91
[2]   PHOTOLUMINESCENCE OF LOW-ENERGY ION BOMBARDED SILICON [J].
DAVIS, RJ ;
HABERMEIER, HU ;
WEBER, J .
APPLIED PHYSICS LETTERS, 1985, 47 (12) :1295-1297
[3]  
HARRIS CI, 1989, EMRS P STRASBOURG
[4]  
IBBOTSON DE, 1988, PURE APPL CHEM, V5, P703
[5]  
LOW TS, 1983, I PHYS C SER, V65, P515
[6]  
NORTHROP GA, 1986, DEFECTS SEMICONDUCTO, P1253
[7]  
SHINGU Z, 1987, I PHYS C SER, V91, P447
[8]   PHOTOLUMINESCENCE STUDIES OF DEFECTS AND IMPURITIES IN ANNEALED GAAS [J].
VANDEVEN, J ;
HARTMANN, WJAM ;
GILING, LJ .
JOURNAL OF APPLIED PHYSICS, 1986, 60 (10) :3735-3745
[9]   NEW METHOD TO DETERMINE THE CARBON CONCENTRATION IN SILICON [J].
WEBER, J ;
SINGH, M .
APPLIED PHYSICS LETTERS, 1986, 49 (23) :1617-1619
[10]  
1982, LANDOLTBORSTEIN, V111