DESIGN OF BIPOLAR IMAGING DEVICE (BASIS)

被引：6

作者：

NAKAMURA, Y ^{[1
]}

OHZU, H ^{[1
]}

MIYAWAKI, M ^{[1
]}

TANAKA, N ^{[1
]}

OHMI, T ^{[1
]}

机构：

[1] TOHOKU UNIV,FAC ENGN,DEPT ELECTR,SENDAI,MIYAGI 980,JAPAN

来源：

IEEE TRANSACTIONS ON ELECTRON DEVICES | 1991年 / 38卷 / 05期

关键词：

D O I：

10.1109/16.78375

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The design methodology of a bipolar imaging device (BASIS) consisting of a capacitor-loaded emitter-follower circuitry has been established by analyzing the basic operation of BASIS and the generation mechanism of fixed pattern noise, where theoretical results coincide well with experimental results. From this methodology, a wide dynamic range of linearity is assured by optimizing the forward-bias voltage in readout operation, while high sensitivity is realized by designing the base to collector junction capacitance C(bc) as small as possible and by designing the emitter common current gain h(FE) of a phototransistor in a pixel to be as high as possible. In order to reduce fixed pattern noise, nonuniformities of h(FE) and C(bc) should be made as small as possible by improving fabrication process technology, while the "bootstrap factor" K(f) defined in this theory should be designed as small as possible.

引用

页码：1028 / 1036

页数：9

共 5 条

[1] REDUCTION OF FIXED-PATTERN NOISE OF BASIS DUE TO LOW KINETIC-ENERGY REACTIVE ION AND NATIVE-OXIDE-FREE PROCESSING [J].

MIYAWAKI, M ;

OHMI, T .

IEEE TRANSACTIONS ON ELECTRON DEVICES, 1991, 38 (05) :1037-1043

[2] A LOW-NOISE BI-CMOS LINEAR IMAGE SENSOR WITH AUTO-FOCUSING FUNCTION [J].

TANAKA, N ;

OHMI, T ;

NAKAMURA, Y ;

MATSUMOTO, S .

IEEE TRANSACTIONS ON ELECTRON DEVICES, 1989, 36 (01) :39-45

[3] A 310K PIXEL BIPOLAR IMAGER (BASIS) [J].

TANAKA, N ;

HASHIMOTO, S ;

SHINOHARA, M ;

SUGAWA, S ;

MORISHITA, M ;

MATSUMOTO, S ;

NAKAMURA, Y ;

OHMI, T .

IEEE TRANSACTIONS ON ELECTRON DEVICES, 1990, 37 (04) :964-971

[4] A NOVEL BIPOLAR IMAGING DEVICE WITH SELF-NOISE-REDUCTION CAPABILITY [J].

TANAKA, N ;

OHMI, T ;

NAKAMURA, Y .

IEEE TRANSACTIONS ON ELECTRON DEVICES, 1989, 36 (01) :31-38

[5]

TANAKA N, 1989, FEB ISSCC, P96

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