CORRECTION OF ERRORS OWING TO THERMAL ELONGATION OF HIGH-TEMPERATURE COAXIAL PROBE FOR MICROWAVE PERMITTIVITY MEASUREMENT

被引：10

作者：

ARAI, M ^{[1
]}

BINNER, JGP ^{[1
]}

CROSS, TE ^{[1
]}

机构：

[1] UNIV NOTTINGHAM,DEPT ELECT & ELECTR ENGN,NOTTINGHAM NG7 2RD,ENGLAND

来源：

ELECTRONICS LETTERS | 1995年 / 31卷 / 14期

关键词：

DIELECTRIC MEASUREMENT; MICROWAVE MEASUREMENT; PERMITTIVITY MEASUREMENT;

D O I：

10.1049/el:19950780

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A method for correcting errors owing to the thermal elongation of high temperature coaxial probe for microwave permittivity measurement has been developed. The method has been verified by measuring the open circuit permittivity of the probe which operates up to 1200 degrees C.

引用

页码：1138 / 1139

页数：2

共 6 条

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ELECTRONICS LETTERS, 1995, 31 (02) :115-117

[2]

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[4] A CRITICAL-STUDY OF THE OPEN-ENDED COAXIAL LINE SENSOR TECHNIQUE FOR RF AND MICROWAVE COMPLEX PERMITTIVITY MEASUREMENTS [J].

GRANT, JP ;

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SYMM, GT ;

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[5] REFLECTION OF AN OPEN-ENDED COAXIAL LINE AND APPLICATION TO NON-DESTRUCTIVE MEASUREMENT OF MATERIALS [J].

MOSIG, JR ;

BESSON, JCE ;

GEXFABRY, M ;

GARDIOL, FE .

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[6]

SALSMAN JB, 1991, AM CERAM SOC CERAM T, V21, P203

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