PHASE INTERGROWTH IN BI2SR2CA2CU3OX SUPERCONDUCTING THIN-FILMS PREPARED BY SINGLE CYLINDRICAL-SPUTTERING GUN

被引：21

作者：

OHKUBO, M

GEERK, J

LINKER, G

MEYER, O

机构：

[1] Forschungszentrum Karlsruhe, Technik und Umwelt, Institut für Nukleare Festkörperphysik, D-76021 Karlsruhe

[2] Electrotechnical Laboratory, Tsukuba, Ibaraki

来源：

APPLIED PHYSICS LETTERS | 1995年 / 67卷 / 16期

关键词：

D O I：

10.1063/1.114561

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Bi2Sr2Can-1CunOx thin films have been prepared in situ on MgO(100) by dc-sputtering employing a single cylindrical target. The thin films are of almost pure Bi2Sr2Ca2Cu3Ox (2223) or intergrowth phases known as random stacking-fault structures of two phases having adjacent n. Deviations from the sputtering conditions for the 2223 growth induce the phase intergrowth of 2212, 2223,and 2234. The phase intergrowth occurs in connection with film compositions.` (C) 1995 American Institute of Physics.

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页码：2403 / 2405

页数：3

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