MATERIALS CHARACTERIZATION AND DEFECT DETECTION IN CERAMICS BY MEANS OF THE SCANNING LASER ACOUSTIC MICROSCOPE (SLAM)

被引：0

作者：

VORRES, CL ^{[1
]}

ORAVECZ, MG ^{[1
]}

KESSLER, LW ^{[1
]}

机构：

[1] SONOSCAN INC,BENSENVILLE,IL

来源：

AMERICAN CERAMIC SOCIETY BULLETIN | 1983年 / 62卷 / 08期

关键词：

D O I：

暂无

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：870 / 870

页数：1

共 50 条

[41] SCANNING-LASER ACOUSTIC MICROSCOPY EVALUATES CERAMICS
CARTS, YA
[J]. LASER FOCUS-ELECTRO-OPTICS, 1988, 24 (11): : 28 - &
[42] APPLICATIONS OF THE SCANNING REFLECTION ACOUSTIC MICROSCOPE TO THE STUDY OF MATERIALS SCIENCE
WEAVER, JMR
SOMEKH, MG
BRIGGS, GAD
PECK, SD
ILETT, C
[J]. IEEE TRANSACTIONS ON SONICS AND ULTRASONICS, 1985, 32 (02): : 302 - 312
[43] STUDY OF DEFECTS IN OPTOELECTRONIC MATERIALS USING A SCANNING ACOUSTIC MICROSCOPE
SULEWSKI, PE
DYNES, RC
MAHAJAN, S
BISHOP, DJ
[J]. JOURNAL OF APPLIED PHYSICS, 1983, 54 (10) : 5711 - 5714
[44] EXAMINATION OF FRESH AND FIXED TISSUE WITH THE SCANNING LASER ACOUSTIC MICROSCOPE
OBRIEN, WD
GOSS, SA
[J]. MICROSCOPE, 1978, 26 (04) : 216 - 217
[45] MODIFICATION OF THE SCANNING LASER ACOUSTIC MICROSCOPE FOR HOLOGRAPHIC AND TOMOGRAPHIC IMAGING
LEE, H
RICCI, C
[J]. APPLIED PHYSICS LETTERS, 1986, 49 (20) : 1336 - 1338
[46] MEASUREMENT OF SOUND-VELOCITY WITH THE SCANNING LASER ACOUSTIC MICROSCOPE
GRANT, DR
BERNARDIN, JE
[J]. JOURNAL OF THE ACOUSTICAL SOCIETY OF AMERICA, 1981, 69 (03) : 866 - 868
[47] AN EXAMINATION OF SEDIMENTARY MINERALS AND ROCKS WITH THE SCANNING LASER ACOUSTIC MICROSCOPE
BROWN, J
PIRIE, G
[J]. IEEE TRANSACTIONS ON SONICS AND ULTRASONICS, 1982, 29 (03): : 179 - 179
[48] ULTRASONIC ASSESSMENT OF SKIN AND WOUNDS WITH THE SCANNING LASER ACOUSTIC MICROSCOPE
OLERUD, JE
OBRIEN, W
RIEDERERHENDERSON, MA
STEIGER, D
FORSTER, FK
DALY, C
KETTERER, DJ
ODLAND, GF
[J]. JOURNAL OF INVESTIGATIVE DERMATOLOGY, 1987, 88 (05) : 615 - 623
[49] DEFECT DETECTION USING A SCANNING LASER SOURCE
Burrows, S. E.
Dixon, S.
[J]. REVIEW OF PROGRESS IN QUANTITATIVE NONDESTRUCTIVE EVALUATION, VOLS 30A AND 30B, 2011, 1335 : 249 - 256
[50] Spatially resolved characterization of superconducting films and cryoelectronic devices by means of low temperature scanning laser microscope
Sivakov, AG
Zhuravel, AP
Turutanov, OG
Dmitrenko, IM
[J]. APPLIED SURFACE SCIENCE, 1996, 106 : 390 - 395

← 1 2 3 4 5 →