HIGH CRITICAL-CURRENT DENSITY NBN/ALN/NBN TUNNEL-JUNCTIONS FABRICATED ON AMBIENT-TEMPERATURE MGO SUBSTRATES

被引:61
作者
WANG, Z
KAWAKAMI, A
UZAWA, Y
KOMIYAMA, B
机构
[1] Kansai Advanced Research Center, Communications Research Laboratory, Ministry of Posts and Telecommunications, Nishi-ku, Kobe, 651-24, 588-2 Iwaoka, Iwaoka-cho
关键词
D O I
10.1063/1.111730
中图分类号
O59 [应用物理学];
学科分类号
摘要
NbN/AlN/NbN tunnel junctions are fabricated at ambient temperature on MgO substrates, and a critical current density of 8 kA/cm2 is obtained in junctions with 1.5-nm-thick AlN barriers. Even though the NbN/AlN/NbN trilayers are deposited without intentional heating, the junctions show a large gap voltage (V(g)=5 mV), sharp quasiparticle current rise (DELTAV(g)=0.16 mV), and small subgap leakage current (V(m)=25 mV and R(sg)/R(N)=9). This report shows that high-quality NbN/AlN/NbN tunnel junctions can be made at ambient substrate temperature.
引用
收藏
页码:2034 / 2036
页数:3
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