CHARGING PHENOMENA IN THE SCANNING ELECTRON-MICROSCOPY OF CONDUCTOR-INSULATOR COMPOSITES - A TOOL FOR COMPOSITE STRUCTURAL-ANALYSIS

被引：34
作者：
CHUNG, KT
REISNER, JH
CAMPBELL, ER
机构：
来源：
JOURNAL OF APPLIED PHYSICS | 1983年 / 54卷 / 11期
关键词：
D O I：
10.1063/1.331946
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
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页码：6099 / 6112
页数：14
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