UNIVERSAL RELATION BETWEEN ELECTRON CHANNELING LINE INTENSITY AND THICKNESS OF DISORDERED LAYERS ON SINGLE-CRYSTALS

被引：5

作者：

SUZUKI, T

KIDO, Y

机构：

来源：

APPLIED PHYSICS LETTERS | 1988年 / 53卷 / 16期

关键词：

D O I：

10.1063/1.99973

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1486 / 1488

页数：3

共 8 条

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