MEASUREMENT OF LATTICE-FRINGE VECTORS FROM DIGITAL HREM IMAGES - EXPERIMENTAL PRECISION

被引：47

作者：

DERUIJTER, WJ

SHARMA, R

MCCARTNEY, MR

SMITH, DJ

机构：

[1] ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85287

[2] ARIZONA STATE UNIV,CTR SOLID STATE SCI,TEMPE,AZ 85287

来源：

ULTRAMICROSCOPY | 1995年 / 57卷 / 04期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1016/0304-3991(94)00166-K

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

The practical measurement of lattice-fringe spacings and angles recorded in digital high-resolution electron micrographs is evaluated experimentally. The method is based on a statistical estimation procedure and involves computer analysis of reciprocal-space parameters. This work concentrates on the analysis of images recorded with slow-scan CCD cameras, but alternative methods of image pick-up are also briefly considered. The method has been successfully applied to images recorded with electron doses smaller than 1 e/Angstrom(2) and for sample dimensions as small as 8 Angstrom across. The practical precision depends on specimen characteristics, electron dose and the size of the measurement area and is in the range of 0.001-0.05 Angstrom for lattice spacings, and 0.1 degrees-0.5 degrees for lattice-plane angles. Finally, the technique is demonstrated in studies of a catalyst system, of a reduced surface oxide phase and of TiO2 and TiN particles.

引用

页码：409 / 422

页数：14

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