SCANNING TUNNELING MICROSCOPY IMAGING OF MICROBRIDGES UNDER SCANNING ELECTRON-MICROSCOPY CONTROL

被引：10
|
作者：
ANDERS, M
THAER, M
MUCK, M
HEIDEN, C
机构：
来源：
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1988年 / 6卷 / 02期
关键词：
D O I：
10.1116/1.575390
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
引用
收藏
页码：436 / 439
页数：4
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