共 50 条
- [23] ATOMIC-LEVEL COMPOSITION AND STRUCTURE AT INTERFACES BY HIGH-RESOLUTION ELECTRON-MICROSCOPY INSTITUTE OF PHYSICS CONFERENCE SERIES, 1989, (100): : 17 - 22
- [24] ATOMIC-LEVEL COMPOSITION AND STRUCTURE AT INTERFACES BY HIGH-RESOLUTION ELECTRON-MICROSCOPY MICROSCOPY OF SEMICONDUCTING MATERIALS 1989, 1989, 100 : 17 - 22
- [25] ATOMIC-SCALE STRUCTURE STUDY BY HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY MATERIALS TRANSACTIONS JIM, 1990, 31 (05): : 353 - 362
- [26] HIGH-RESOLUTION ELECTRON-MICROSCOPY OF TISI2 ON DOPED SI HELVETICA PHYSICA ACTA, 1987, 60 (02): : 252 - 252
- [28] DETERMINATION OF THE ATOMIC-STRUCTURE OF THE EPITAXIAL COSI2-SI(111) INTERFACE USING HIGH-RESOLUTION RUTHERFORD BACKSCATTERING PHYSICAL REVIEW B, 1988, 37 (11): : 6305 - 6310