STUDY OF TRAPPING IN AMORPHOUS MATERIALS

被引:4
作者
BOTILA, T
HENISCH, HK
机构
[1] PENN STATE UNIV,DEPT PHYS,UNIVERSITY PK,PA 16802
[2] PENN STATE UNIV,MAT RES LAB,UNIVERSITY PK,PA 16802
来源
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1976年 / 38卷 / 01期
关键词
D O I
10.1002/pssa.2210380137
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:331 / 337
页数:7
相关论文
共 23 条
[1]   ANALYSIS OF THERMALLY STIMULATED CAPACITOR-DISCHARGE METHOD FOR CHARACTERIZING LOCALIZED STATES IN AMORPHOUS-SEMICONDUCTORS [J].
AGARWAL, SC .
PHYSICAL REVIEW B, 1974, 10 (10) :4340-4350
[2]   ATTEMPTS TO MEASURE THERMALLY STIMULATED CURRENTS IN CHALCOGENIDE GLASSES [J].
AGARWAL, SC ;
FRITZSCHE, H .
PHYSICAL REVIEW B, 1974, 10 (10) :4351-4357
[3]   THERMALLY AND PHOTON-STIMULATED DEPOLARIZATION CURRENTS IN KRS-5 CRYSTALS POLARIZED BY LIGHT [J].
BOTILA, T ;
CROITORI.N .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1973, 19 (01) :357-363
[4]  
BOTILA T, 1974, AMORPHOUS LIQUID SEM, V2, P799
[5]  
FRITZSCHE H, COMMUNICATION
[6]  
FRITZSCHE H, 1975, OCT P S THERM PHOT C, P144
[7]   ELECTRICAL CHARACTERISTICS OF A METAL-SEMICONDUCTOR CONTACT .3. [J].
GOSSICK, BR .
SURFACE SCIENCE, 1971, 28 (02) :469-&
[8]  
GRIGOROVICI R, COMMUNICATION
[9]  
MOSS JS, 1973, SEMICONDUCTOR OPTIC
[10]  
MOTT NF, COMMUNICATION